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Difference between revisions of "10 nm lithography process"

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== References ==
 
== References ==
 +
* Mark Bohr, Intel. Intel Technology and Manufacturing Day. Mar 28, 2017.
 
* Cho, H-J., et al. "Si FinFET based 10nm technology with multi Vt gate stack for low power and high performance applications." VLSI Technology, 2016 IEEE Symposium on. IEEE, 2016.
 
* Cho, H-J., et al. "Si FinFET based 10nm technology with multi Vt gate stack for low power and high performance applications." VLSI Technology, 2016 IEEE Symposium on. IEEE, 2016.
 
* Song, Taejoong, et al. "A 10 nm FinFET 128 Mb SRAM With Assist Adjustment System for Power, Performance, and Area Optimization." IEEE Journal of Solid-State Circuits (2016).
 
* Song, Taejoong, et al. "A 10 nm FinFET 128 Mb SRAM With Assist Adjustment System for Power, Performance, and Area Optimization." IEEE Journal of Solid-State Circuits (2016).
* Intel data Based on a presentation by Mark Bohr, Intel
+
* Clinton, Michael, et al. "12.3 A low-power and high-performance 10nm SRAM architecture for mobile applications." Solid-State Circuits Conference (ISSCC), 2017 IEEE International. IEEE, 2017.
  
 
[[Category:Lithography]]
 
[[Category:Lithography]]

Revision as of 00:40, 5 April 2017

The 10 nanometer (10 nm) lithography process is a full node semiconductor manufacturing process following the 14 nm process stopgap. The term "10 nm" is simply a commercial name for a generation of a certain size and its technology, as opposed to gate length or half pitch. Commercial mass production of integrated circuit manufacturing using 10 nm process begun with risk production in late 2016 and ramped up in mid-to-late 2017. This technology is set to be replaced by 7 nm process 2019.

Industry

Announced during Intel's Technology and Manufacturing Day 2017, Intel's 10 nm process (P1274) is the first high-volume manufacturing process to employ Self-Aligned Quad Patterning (SAQP) with production starting in the second half of 2017. Samsung, which unlike Intel uses LELELE (litho-etch-litho-etch-litho-etch), plans ramp up mass production in May of 2017.

Due to marketing names the transistor sizes vary considerably between leading manufactures. For example, Intel's 10nm process is denser and smaller than TSMC's 7 nm process while Samsung's 10 nm process is more similar to Intel's 14 nm process.

Symbol version future.svg Preliminary Data! Information presented in this article deal with future products, data, features, and specifications that have yet to be finalized, announced, or released. Information may be incomplete and can change by final release.


 
Process Name
1st Production
Lithography Lithography
Immersion
Exposure
Wafer Type
Size
Transistor Type
Voltage
 
Fin Pitch
Width
Height
Gate Length (Lg)
Contacted Gate Pitch (CPP)
Minimum Metal Pitch (MMP)
SRAM bitcell High-Perf (HP)
High-Density (HD)
Low-Voltage (LV)
DRAM bitcell eDRAM
Intel Samsung TSMC
P1274 (CPU) / P1275 (SoC) 10LPE
1st generation; 10 nm Low Power Early
, 10LPP
2nd generation; 10 nm Low Power Performance
, 10LPU
3rd generation; 10 nm Low Power Ultimate
2017 2017 2017
193 nm colspan="2" colspan="2" |
Yes colspan="2" colspan="2" |
SAQP colspan="2" colspan="2" |
Bulk Bulk Bulk
300 mm 300 mm 300 mm
FinFET FinFET FinFET
  colspan="2" colspan="2" |
Value 14 nm Δ Value 14 nm Δ Value 16 nm Δ
34 nm 0.81x
   
53 nm 1.26x
   
54 nm 0.77x 64 nm 0.82x 64 nm 0.71x
36 nm 0.69x 48 nm 0.75x 42 nm 0.66x
0.0441 µm² 0.75x 0.049 µm² 0.61x
0.0367 µm² 0.62x 0.040 µm² 0.63x 0.042 µm² 0.57x
0.3120 µm²  
   

Samsung

Samsung demonstrated their 128 Mebibit SRAM wafer from their 10nm FinFET process.

10 nm Microprocessors

This list is incomplete; you can help by expanding it.

10 nm Microarchitectures

This list is incomplete; you can help by expanding it.

Documents

References

  • Mark Bohr, Intel. Intel Technology and Manufacturing Day. Mar 28, 2017.
  • Cho, H-J., et al. "Si FinFET based 10nm technology with multi Vt gate stack for low power and high performance applications." VLSI Technology, 2016 IEEE Symposium on. IEEE, 2016.
  • Song, Taejoong, et al. "A 10 nm FinFET 128 Mb SRAM With Assist Adjustment System for Power, Performance, and Area Optimization." IEEE Journal of Solid-State Circuits (2016).
  • Clinton, Michael, et al. "12.3 A low-power and high-performance 10nm SRAM architecture for mobile applications." Solid-State Circuits Conference (ISSCC), 2017 IEEE International. IEEE, 2017.