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Difference between revisions of "32 nm lithography process"
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− | ! Layer !! Pitch !! Thick !! Aspect Ratio | + | ! Layer !! Pitch !! Thick !! Aspect Ratio !! Image |
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− | | Isolation || 140 nm || 200 || - | + | | Isolation || 140 nm || 200 || - || rowspan="11" | [[file:intel 32nm design rules.png|750px]] |
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| Contacted Gate || 112.5 nm || 35 nm || -- | | Contacted Gate || 112.5 nm || 35 nm || -- |
Revision as of 19:10, 30 November 2016
The 32 nanometer (32 nm) lithography process is a full node semiconductor manufacturing process following the 40 nm process stopgap. Commercial integrated circuit manufacturing using 32 nm process began in 2010. This technology was superseded by the 28 nm process (HN) / 22 nm process (FN) in 2012.
Contents
Industry
TSMC cancelled its planned 32nm node process.
Fab |
---|
Process Name |
1st Production |
Type |
Wafer |
|
Contacted Gate Pitch |
Interconnect Pitch (M1P) |
SRAM bit cell (HD) |
SRAM bit cell (HS) |
SRAM bit cell (LP) |
DRAM bit cell |
Common Platform | Intel | TSMC | Samsung | Toshiba / NEC | Common Platform 2 | ||||||
---|---|---|---|---|---|---|---|---|---|---|---|
P1268 | |||||||||||
2009 | 2009 | 2009 | 2009 | 2009 | 2010 | ||||||
PDSOI | Bulk | ||||||||||
300mm | |||||||||||
Value | 45 nm Δ | Value | 45 nm Δ | Value | 40 nm Δ | Value | 40 nm Δ | Value | 40 nm Δ | Value | 45 nm Δ |
130 nm | 0.68x | 112.5 nm | 0.63x | 130 nm | 0.80x | 113.4 nm | 0.88x | 120 nm | 0.71x | 126 nm | 0.66x |
? nm | ?x | 112.5 nm | 0.70x | ? nm | ?x | 113.4 nm | 0.97x | ? nm | ?x | ?nm | ?x |
0.15 µm2 | 0.41x | 0.148 µm2 | 0.43x | 0.15 µm2 | 0.62x | 0.120 µm2 | ?x | 0.124 µm2 | 0.64x | 0.157 µm2 | 0.42x |
0.199 µm2 | |||||||||||
0.171 µm2 | 0.45x | ||||||||||
0.039 µm2 | 0.58x |
Design Rules
Find models
Click to browse all 32 nm MPU models
32 nm Microprocessors
- AMD
- Intel
- UC Davis
- Princeton
This list is incomplete; you can help by expanding it.
32 nm Microarchitectures
- Intel
- AMD
This list is incomplete; you can help by expanding it.