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{{lithography processes}} | {{lithography processes}} | ||
− | The '''3 | + | The '''3 nanometer (3 nm or 30 Å) lithography process''' is a [[technology node]] semiconductor manufacturing process following the [[5 nm lithography process|5 nm process]] node. Commercial [[integrated circuit]] manufacturing using 3 nm process is set to begin some time around 2023. |
+ | |||
+ | The term "3 nm" is simply a commercial name for a generation of a certain size and its technology, and '''does not''' represent any geometry of the transistor. | ||
== Industry == | == Industry == | ||
− | |||
− | == 3 | + | {{future information}} |
+ | |||
+ | {{finfet nodes comp | ||
+ | <!-- Intel --> | ||
+ | | process 1 fab = [[Intel]] | ||
+ | | process 1 name = P1278 (CPU), P1279? (SoC) | ||
+ | | process 1 date = 2H 2023 | ||
+ | | process 1 lith = EUV | ||
+ | | process 1 immersion = | ||
+ | | process 1 exposure = SE | ||
+ | | process 1 wafer type = Bulk | ||
+ | | process 1 wafer size = 300 mm | ||
+ | | process 1 transistor = FinFET | ||
+ | | process 1 volt = | ||
+ | | process 1 delta from = [[5 nm]] Δ | ||
+ | | process 1 fin pitch = | ||
+ | | process 1 fin pitch Δ = | ||
+ | | process 1 fin width = | ||
+ | | process 1 fin width Δ = | ||
+ | | process 1 fin height = | ||
+ | | process 1 fin height Δ = | ||
+ | | process 1 gate len = | ||
+ | | process 1 gate len Δ = | ||
+ | | process 1 cpp = | ||
+ | | process 1 cpp Δ = | ||
+ | | process 1 mmp = | ||
+ | | process 1 mmp Δ = | ||
+ | | process 1 sram hp = | ||
+ | | process 1 sram hp Δ = | ||
+ | | process 1 sram hd = | ||
+ | | process 1 sram hd Δ = | ||
+ | | process 1 sram lv = | ||
+ | | process 1 sram lv Δ = | ||
+ | | process 1 dram = | ||
+ | | process 1 dram Δ = | ||
+ | <!-- TSMC --> | ||
+ | | process 2 fab = [[TSMC]] | ||
+ | | process 2 name = N3, N3E <info>N3 Enhanced</info> | ||
+ | | process 2 date = 2H 2022 | ||
+ | | process 2 lith = EUV | ||
+ | | process 2 immersion = | ||
+ | | process 2 exposure = SE | ||
+ | | process 2 wafer type = Bulk | ||
+ | | process 2 wafer size = 300 mm | ||
+ | | process 2 transistor = FinFET | ||
+ | | process 2 volt = | ||
+ | | process 2 delta from = [[5 nm]] Δ | ||
+ | | process 2 fin pitch = | ||
+ | | process 2 fin pitch Δ = | ||
+ | | process 2 fin width = | ||
+ | | process 2 fin width Δ = | ||
+ | | process 2 fin height = | ||
+ | | process 2 fin height Δ = | ||
+ | | process 2 gate len = | ||
+ | | process 2 gate len Δ = | ||
+ | | process 2 cpp = | ||
+ | | process 2 cpp Δ = | ||
+ | | process 2 mmp = | ||
+ | | process 2 mmp Δ = | ||
+ | | process 2 sram hp = | ||
+ | | process 2 sram hp Δ = | ||
+ | | process 2 sram hd = | ||
+ | | process 2 sram hd Δ = | ||
+ | | process 2 sram lv = | ||
+ | | process 2 sram lv Δ = | ||
+ | | process 2 dram = | ||
+ | | process 2 dram Δ = | ||
+ | <!-- Samsung --> | ||
+ | | process 4 fab = [[Samsung]] | ||
+ | | process 4 name = 3GAE<info>3nm Gate All Around Early</info>, 3GAP<info>3nm Gate All Around | ||
+ | | process 1 date = 1H 2022 | ||
+ | Plus</info> | ||
+ | | process 4 date = | ||
+ | | process 4 lith = EUV | ||
+ | | process 4 immersion = | ||
+ | | process 4 exposure = SE | ||
+ | | process 4 wafer type = Bulk | ||
+ | | process 4 wafer size = 300 mm | ||
+ | | process 4 transistor = GAA | ||
+ | | process 4 volt = | ||
+ | | process 4 delta from = [[5 nm]] Δ | ||
+ | | process 4 fin pitch = - | ||
+ | | process 4 fin pitch Δ = | ||
+ | | process 4 fin width = | ||
+ | | process 4 fin width Δ = | ||
+ | | process 4 fin height = | ||
+ | | process 4 fin height Δ = | ||
+ | | process 4 gate len = | ||
+ | | process 4 gate len Δ = | ||
+ | | process 4 cpp = | ||
+ | | process 4 cpp Δ = | ||
+ | | process 4 mmp = | ||
+ | | process 4 mmp Δ = | ||
+ | | process 4 sram hp = | ||
+ | | process 4 sram hp Δ = | ||
+ | | process 4 sram hd = | ||
+ | | process 4 sram hd Δ = | ||
+ | | process 4 sram lv = | ||
+ | | process 4 sram lv Δ = | ||
+ | | process 4 dram = | ||
+ | | process 4 dram Δ = | ||
+ | }} | ||
+ | ==== P1278 ==== | ||
+ | Intel's 5-nanometer (renamed as Intel 20A) process node is expected to ramp around the 2H2024/2025 timeframe. | ||
+ | === Samsung === | ||
+ | On May 24 2017 Samsung announced they will be switching to a transistor they call ''Multi-Bridge-Channel FET'' (''MBCFET''), an extension of a [[Gate-all-around]] (GAA) FET. This is planned for somewhere after the 5nm node but the exact timeline or specification is currently unknown. | ||
+ | |||
+ | === TSMC === | ||
+ | N3 technology will offer up to 70% logic density gain, up to 15% speed improvement at the same power and up to 30% power reduction at the same speed as compared with N5 technology (According to TSMCs website). If this holds true we could see 300+ MT/mm2. | ||
+ | |||
+ | == 3 nm Microprocessors== | ||
+ | * Apple | ||
+ | ** {{apple|A17 Pro}} | ||
+ | * Apple | ||
+ | ** {{apple|M3}} | ||
+ | * Apple | ||
+ | ** {{apple|M3 Pro}} | ||
+ | * Apple | ||
+ | ** {{apple|M3 MAX}} | ||
{{expand list}} | {{expand list}} | ||
− | == 3 | + | == 3 nm Microarchitectures== |
{{expand list}} | {{expand list}} | ||
− | [[ | + | == References == |
+ | * Kinam Kim, President of Semiconductor Business, announced MBCFET for the node after [[5 nm]], May 24, 2017 | ||
+ | |||
+ | [[category:lithography]] |
Latest revision as of 00:53, 18 September 2024
The 3 nanometer (3 nm or 30 Å) lithography process is a technology node semiconductor manufacturing process following the 5 nm process node. Commercial integrated circuit manufacturing using 3 nm process is set to begin some time around 2023.
The term "3 nm" is simply a commercial name for a generation of a certain size and its technology, and does not represent any geometry of the transistor.
Contents
Industry[edit]
Process Name | |
---|---|
1st Production | |
Lithography | Lithography |
Immersion | |
Exposure | |
Wafer | Type |
Size | |
Transistor | Type |
Voltage | |
Fin | Pitch |
Width | |
Height | |
Gate Length (Lg) | |
Contacted Gate Pitch (CPP) | |
Minimum Metal Pitch (MMP) | |
SRAM bitcell | High-Perf (HP) |
High-Density (HD) | |
Low-Voltage (LV) | |
DRAM bitcell | eDRAM |
Intel | TSMC | Samsung | |||
---|---|---|---|---|---|
P1278 (CPU), P1279? (SoC) | N3, N3E N3 Enhanced |
3GAE 3nm Gate All Around Early , 3GAP3nm Gate All Around
| process 1 date = 1H 2022Plus | |||
2H 2023 | 2H 2022 | ||||
EUV | EUV | EUV | |||
SE | SE | SE | |||
Bulk | Bulk | Bulk | |||
300 mm | 300 mm | 300 mm | |||
FinFET | FinFET | GAA | |||
Value | 5 nm Δ | Value | 5 nm Δ | Value | 5 nm Δ |
N/A | |||||
P1278[edit]
Intel's 5-nanometer (renamed as Intel 20A) process node is expected to ramp around the 2H2024/2025 timeframe.
Samsung[edit]
On May 24 2017 Samsung announced they will be switching to a transistor they call Multi-Bridge-Channel FET (MBCFET), an extension of a Gate-all-around (GAA) FET. This is planned for somewhere after the 5nm node but the exact timeline or specification is currently unknown.
TSMC[edit]
N3 technology will offer up to 70% logic density gain, up to 15% speed improvement at the same power and up to 30% power reduction at the same speed as compared with N5 technology (According to TSMCs website). If this holds true we could see 300+ MT/mm2.
3 nm Microprocessors[edit]
This list is incomplete; you can help by expanding it.
3 nm Microarchitectures[edit]
This list is incomplete; you can help by expanding it.
References[edit]
- Kinam Kim, President of Semiconductor Business, announced MBCFET for the node after 5 nm, May 24, 2017