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Difference between revisions of "10 nm lithography process"

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| ? nm || ?x  || 48 nm<ref name="samsung">Cho, H-J., et al. "Si FinFET based 10nm technology with multi Vt gate stack for low power and high performance applications." VLSI Technology, 2016 IEEE Symposium on. IEEE, 2016.</ref> || 0.75x || ? nm || ?x || ? nm || ?x
 
| ? nm || ?x  || 48 nm<ref name="samsung">Cho, H-J., et al. "Si FinFET based 10nm technology with multi Vt gate stack for low power and high performance applications." VLSI Technology, 2016 IEEE Symposium on. IEEE, 2016.</ref> || 0.75x || ? nm || ?x || ? nm || ?x
 
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| ? µm² || ?x || 0.049 µm²<ref name="samsung2">Samsung, [[IEEE]] [[International Solid-State Circuits Conference]] (ISSCC) 2016</ref> || 0.61x || ? µm² || ?x || ? nm || ?x
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| ? µm² || ?x || 0.049 µm²<ref name="samsung2">Song, Taejoong, et al. "A 10 nm FinFET 128 Mb SRAM With Assist Adjustment System for Power, Performance, and Area Optimization." IEEE Journal of Solid-State Circuits (2016).</ref> || 0.61x || ? µm² || ?x || ? nm || ?x
 
|-
 
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| ? µm² || ?x || 0.040 µm²<ref name="samsung2" /> || 0.63x || ? µm² || ?x || ? nm || ?x
 
| ? µm² || ?x || 0.040 µm²<ref name="samsung2" /> || 0.63x || ? µm² || ?x || ? nm || ?x
 
{{scrolling table/end}}
 
{{scrolling table/end}}
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=== Samsung ===
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Samsung demonstrated their 128 Mebibit [[SRAM]] wafer from their 10nm FinFET process.
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{| class="collapsible collapsed wikitable"
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|-
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! colspan="2" | Samsung 128 Mib SRAM demo 10 nm wafer<ref name="samsung2" />
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|-
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|
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<table class="wikitable">
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<tr><th>Technology</th><td>10nm FinFET</td></tr>
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<tr><th>Supply voltage</th><td>1.8 V (i/o)</td></tr>
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<tr><th>Bit cell size</th><td>0.040 µm²</td></tr>
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<tr><th>macro configs</th><td>256x512 Kib</td></tr>
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<tr><th>Capacity</th><td>256 Mib</td></tr>
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<tr><th>Test Features</th><td>Programmable E-fuse</td></tr>
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<tr><th>Die Size</th><td>75.6mm2²</td></tr>
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</table>
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| [[File:samsung 10nm SRAM block.png|400px]]
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|}
  
 
== 10 nm Microprocessors==
 
== 10 nm Microprocessors==

Revision as of 19:00, 10 March 2017

The 10 nanometer (10 nm) lithography process is a full node semiconductor manufacturing process following the 14 nm process stopgap. The term "10 nm" is simply a commercial name for a generation of a certain size and its technology, as opposed to gate length or half pitch. Commercial mass production of integrated circuit manufacturing using 10 nm process begun in late 2016. This technology is set to be replaced by 7 nm process 2019.

Industry

Symbol version future.svg Preliminary Data! Information presented in this article deal with future products, data, features, and specifications that have yet to be finalized, announced, or released. Information may be incomplete and can change by final release.


Fab
Process Name​
1st Production​
 ​
Fin Pitch​
Fin Width​
Fin Height​
Contacted Gate Pitch​
Interconnect Pitch (M1P)​
SRAM bit cell (HP)​
SRAM bit cell (HD)
Intel Samsung TSMC SK Hynix
P1274 10LPE
1st generation; 10 nm Low Power Early
, 10LPP
2nd generation; 10 nm Low Power Performance
, 10LPU
3rd generation; 10 nm Low Power Ultimate
 
2017 2017 2017 2017
Value 14 nm Δ Value 14 nm Δ Value 16 nm Δ Value 18 nm Δ
 ? nm  ?x  ? nm  ?x  ? nm  ?x  ? nm  ?x
 ? nm  ?x  ? nm  ?x  ? nm  ?x  ? nm  ?x
 ? nm  ?x  ? nm  ?x  ? nm  ?x  ? nm  ?x
54 nm[1] 0.77x 64 nm[2] 0.82x  ? nm  ?x  ? nm  ?x
 ? nm  ?x 48 nm[2] 0.75x  ? nm  ?x  ? nm  ?x
 ? µm²  ?x 0.049 µm²[3] 0.61x  ? µm²  ?x  ? nm  ?x
 ? µm²  ?x 0.040 µm²[3] 0.63x  ? µm²  ?x  ? nm  ?x

Samsung

Samsung demonstrated their 128 Mebibit SRAM wafer from their 10nm FinFET process.

10 nm Microprocessors

This list is incomplete; you can help by expanding it.

10 nm Microarchitectures

This list is incomplete; you can help by expanding it.

References

  1. Based on a presentation by Mark Bohr, Intel
  2. 2.0 2.1 Cho, H-J., et al. "Si FinFET based 10nm technology with multi Vt gate stack for low power and high performance applications." VLSI Technology, 2016 IEEE Symposium on. IEEE, 2016.
  3. 3.0 3.1 3.2 Song, Taejoong, et al. "A 10 nm FinFET 128 Mb SRAM With Assist Adjustment System for Power, Performance, and Area Optimization." IEEE Journal of Solid-State Circuits (2016).