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Difference between revisions of "16 nm lithography process"
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| process 1 fab = [[TSMC]] | | process 1 fab = [[TSMC]] | ||
− | | process 1 name = 16FF, 16FF+ | + | | process 1 name = 16FF, 16FF+, 12FFN |
| process 1 date = 2016 | | process 1 date = 2016 | ||
| process 1 lith = 193 nm | | process 1 lith = 193 nm |
Revision as of 19:56, 10 May 2017
The 16 nanometer (16 nm) lithography process is a full node semiconductor manufacturing process following the 20 nm process stopgap. Commercial integrated circuit manufacturing using 16 nm process began in 2014. The term "16 nm" is simply a commercial name for a generation of a certain size and its technology, as opposed to gate length or half pitch. This technology is set to be replaced with 10 nm process in 2017.
Industry
Process Name | |
---|---|
1st Production | |
Lithography | Lithography |
Immersion | |
Exposure | |
Wafer | Type |
Size | |
Transistor | Type |
Voltage | |
Fin | Pitch |
Width | |
Height | |
Gate Length (Lg) | |
Contacted Gate Pitch (CPP) | |
Minimum Metal Pitch (MMP) | |
SRAM bitcell | High-Perf (HP) |
High-Density (HD) | |
Low-Voltage (LV) | |
DRAM bitcell | eDRAM |
TSMC | |
---|---|
16FF, 16FF+, 12FFN | |
2016 | |
193 nm | |
Yes | |
Bulk | |
300 mm | |
FinFET | |
0.75 V | |
Value | 20 nm Δ |
48 nm | N/A |
37 nm | |
34 nm | |
90 nm | 1x |
64 nm | 1x |
0.074 µm² | 0.86x |
TSMC
TSMC demonstrated their 128 Mebibit SRAM wafer from their 16 nm HKMG FinFET process at the 2014 IEEE ISSCC.
16 nm Microprocessors
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16 nm Microarchitectures
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References
- Chen, Yen-Huei, et al. "A 16 nm 128 Mb SRAM in High-κ Metal-Gate FinFET Technology With Write-Assist Circuitry for Low-VMIN Applications." IEEE Journal of Solid-State Circuits 50.1 (2015): 170-177.
- Wu, Shien-Yang, et al. "A 16nm FinFET CMOS technology for mobile SoC and computing applications." Electron Devices Meeting (IEDM), 2013 IEEE International. IEEE, 2013.
- TechInsights/Chipworks, Kevin Gibb, The ConFab 2016