The 5 nanometer (5 nm) lithography process is a technology node semiconductor manufacturing process following the 7 nm process node. Commercial integrated circuit manufacturing using 7 nm process is set to begin sometimes around 2020s.
The term "5 nm" is simply a commercial name for a generation of a certain size and its technology, and does not represent any geometry of a transistor.
Contents
Initial research
- At the 2016 IEEE International Electron Devices Meeting (IEDM), researchers from CEA-Leti presented a paper detailing the architecture for a possible 5 nm node. The researchers presented their functional vertically stacked gate-all-around (GAA) silicon NW/NS (NanoWire/NanoSheet) MOSFETs. GAA NW transistors are a highly promising candidate to succeed FinFETs as the drive current can be optimized by vertically stacking multiple horizontal nanowires.
Industry
Process Name | |
---|---|
1st Production | |
Lithography | Lithography |
Immersion | |
Exposure | |
Wafer | Type |
Size | |
Transistor | Type |
Voltage | |
Fin | Pitch |
Width | |
Height | |
Gate Length (Lg) | |
Contacted Gate Pitch (CPP) | |
Minimum Metal Pitch (MMP) | |
SRAM bitcell | High-Perf (HP) |
High-Density (HD) | |
Low-Voltage (LV) | |
DRAM bitcell | eDRAM |
Intel | TSMC | GlobalFoundries | Samsung | ||||
---|---|---|---|---|---|---|---|
P1278? (CPU), P1279? (SoC) | |||||||
EUV | EUV | EUV | EUV | ||||
Yes | |||||||
SE | EUV | SE | SE | ||||
Bulk | Bulk | Bulk | Bulk | ||||
300 nm | 300 nm | 300 nm | 300 nm | ||||
FinFET | FinFET | GAA | |||||
Value | 10 nm Δ | Value | 10 nm Δ | Value | 10 nm Δ | Value | 7 nm Δ |
N/A | |||||||
~44 nm | 0.81x | ||||||
~32 nm | 0.84x | ||||||
Samsung
On May 24 2017 Samsung announced they will be switching to a transistor they call Multi-Bridge-Channel FET (MBCFET), an extension of a Gate-all-around (GAA) FET. This is planned for somewhere around the 5nm node but the exact timeline or specification is currently unknown.
5 nm Microprocessors
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5 nm Microarchitectures
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References
- TSMC, Estimated at TSMC Technology Symposium, San Jose, March 15, 2017