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Difference between revisions of "20 nm lithography process"

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| ? µm² || ?x || 0.081 µm²<ref name="tsmc">Chang, Jonathan, et al. "A 20nm 112Mb SRAM in High-к metal-gate with assist circuitry for low-leakage and low-V MIN applications." Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2013 IEEE International. IEEE, 2013.</ref> || 0.64x
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| ? µm² || ?x || 0.081 µm² || 0.64x
 
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! colspan="2" | TSMC 112 Mib SRAM demo 20 nm wafer<ref name="tsmc" />
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! colspan="2" | TSMC 112 Mib SRAM demo 20 nm wafer
 
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== References ==
 
== References ==
{{reflist}}
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* Chang, Jonathan, et al. "A 20nm 112Mb SRAM in High-к metal-gate with assist circuitry for low-leakage and low-V MIN applications." Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2013 IEEE International. IEEE, 2013.
  
 
[[Category:Lithography]]
 
[[Category:Lithography]]

Revision as of 19:16, 15 March 2017

The 20 nanometer (20 nm) lithography process is a half-node semiconductor manufacturing process used as a stopgap between the 22 nm and 16 nm processes. The term "20 nm" is simply a commercial name for a generation of a certain size and its technology, as opposed to gate length or half pitch. Commercial integrated circuit manufacturing using 20 nm process began in 2014. This technology superseded by commercial 16 nm process.

Industry

Fab
Wafer​
 ​
Contacted Gate Pitch​
Interconnect Pitch (M1P)​
SRAM bit cell
Samsung TSMC
300mm
Value 28 nm Δ Value 28 nm Δ
64 nm 0.71x 87 nm 0.71x
64 nm 0.67x 67 nm 0.70x
 ? µm²  ?x 0.081 µm² 0.64x

TSMC

TSMC demonstrated their 112 Mebibit SRAM wafer from their 20 nm HKMG process at the 2013 IEEE ISSCC.

20 nm Microprocessors

This list is incomplete; you can help by expanding it.

20 nm Microarchitectures

This list is incomplete; you can help by expanding it.

References

  • Chang, Jonathan, et al. "A 20nm 112Mb SRAM in High-к metal-gate with assist circuitry for low-leakage and low-V MIN applications." Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2013 IEEE International. IEEE, 2013.