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90 nm lithography process

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The 90 nanometer (90 nm) lithography process is a full node semiconductor manufacturing process following the 110 nm process stopgap.

Commercial integrated circuit manufacturing using 90 nm process began in 2003.

This technology was superseded by the 80 nm (HN) / 65 nm process (FN) in 2006.

Industry

45nm SRAM photo.JPG

Introduced in late 2002, Intel's 90 nm process became the first volume production to introduce strained silicon transistors.

Specifications

Fab /
Manuf
Process Name​
1st Production​
Type​
Wafer​
Metal Layers​
 ​
Contacted
Gate Pitch​
Interconnect
Pitch (M1P)​
SRAM
bit cell​
DRAM
bit cell
Intel TSMC Samsung Fujitsu IBM / Toshiba /
Sony / AMD
Motorola TI
P1262 CS-100 / CS-101 HiPerMOS 8
2002 2003 2003 2004 2003 2004 2005
Bulk PDSOI Bulk
300mm
7 10 9
Value 130 nm Δ Value 130 nm Δ Value 130 nm Δ Value 130 nm Δ Value 130 nm Δ Value 130 nm Δ Value 130 nm Δ
260 nm 0.82x 240 nm 0.77x 245 nm 0.70x  ? nm  ?x  ? nm  ?x  ? nm  ?x  ? nm  ?x
.
220 nm 0.63x 240 nm 0.71x 245 nm 0.70x  ? nm  ?x  ? nm  ?x  ? nm  ?x  ? nm  ?x
.
1.0 µm² 0.50x 0.999
µm²
0.47x 0.999
µm²
 ?x 1.07 µm² 0.54x 0.999
µm²
 ?x  ? µm²  ?x  ? µm²  ?x
0.275
µm²
0.19 µm²  ?x

90 nm Microprocessors

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90 nm Microarchitectures

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