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| process 2 dram = | | process 2 dram = | ||
| process 2 dram Δ = | | process 2 dram Δ = | ||
| + | <!-- GlobalFoundries --> | ||
| + | | process 3 fab = [[GlobalFoundries]] | ||
| + | | process 3 name = | ||
| + | | process 3 date = | ||
| + | | process 3 lith = EUV | ||
| + | | process 3 immersion = | ||
| + | | process 3 exposure = SE | ||
| + | | process 3 wafer type = Bulk | ||
| + | | process 3 wafer size = 300 nm | ||
| + | | process 3 transistor = | ||
| + | | process 3 volt = | ||
| + | | process 3 delta from = [[5 nm]] Δ | ||
| + | | process 3 fin pitch = | ||
| + | | process 3 fin pitch Δ = | ||
| + | | process 3 fin width = | ||
| + | | process 3 fin width Δ = | ||
| + | | process 3 fin height = | ||
| + | | process 3 fin height Δ = | ||
| + | | process 3 gate len = | ||
| + | | process 3 gate len Δ = | ||
| + | | process 3 cpp = | ||
| + | | process 3 cpp Δ = | ||
| + | | process 3 mmp = | ||
| + | | process 3 mmp Δ = | ||
| + | | process 3 sram hp = | ||
| + | | process 3 sram hp Δ = | ||
| + | | process 3 sram hd = | ||
| + | | process 3 sram hd Δ = | ||
| + | | process 3 sram lv = | ||
| + | | process 3 sram lv Δ = | ||
| + | | process 3 dram = | ||
| + | | process 3 dram Δ = | ||
<!-- Samsung --> | <!-- Samsung --> | ||
| process 4 fab = [[Samsung]] | | process 4 fab = [[Samsung]] | ||
Revision as of 08:15, 18 April 2019
The 3 nanometer (3 nm or 30 Å) lithography process is a technology node semiconductor manufacturing process following the 5 nm process node. Commercial integrated circuit manufacturing using 3 nm process is set to begin sometimes around 2023.
The term "3 nm" is simply a commercial name for a generation of a certain size and its technology, and does not represent any geometry of the transistor.
Industry
| Process Name | |
|---|---|
| 1st Production | |
| Litho- graphy |
Lithography |
| Immersion | |
| Exposure | |
| Wafer | Type |
| Size | |
| Tran- sistor |
Type |
| Voltage | |
| Fin | Pitch |
| Width | |
| Height | |
| Gate Length (Lg) | |
| Contacted Gate Pitch (CPP) | |
| Minimum Metal Pitch (MMP) | |
| SRAM bitcell |
High-Perf (HP) |
| High-Density (HD) | |
| Low-Voltage (LV) | |
| DRAM bitcell |
eDRAM |
| Intel | TSMC | GlobalFoundries | Samsung | ||||
|---|---|---|---|---|---|---|---|
| P1280? (CPU), P1281? (SoC) | 3LLP 3nm Low Power Plus
| ||||||
| EUV | EUV | EUV | EUV | ||||
| SE | SE | SE | SE | ||||
| Bulk | Bulk | Bulk | Bulk | ||||
| 300 nm | 300 nm | 300 nm | 300 nm | ||||
| GAA | |||||||
| Value | 5 nm Δ | Value | 5 nm Δ | Value | 5 nm Δ | Value | 5 nm Δ |
| N/A | |||||||
Samsung
On May 24 2017 Samsung announced they will be switching to a transistor they call Multi-Bridge-Channel FET (MBCFET), an extension of a Gate-all-around (GAA) FET. This is planned for somewhere after the 5nm node but the exact timeline or specification is currently unknown.
3 nm Microprocessors
This list is incomplete; you can help by expanding it.
3 nm Microarchitectures
This list is incomplete; you can help by expanding it.
References
- Kinam Kim, President of Semiconductor Business, announced MBCFET for the node after 5 nm, May 24, 2017