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Difference between revisions of "3 nm lithography process"
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{{lithography processes}} | {{lithography processes}} | ||
The '''3.5 nanometer (3.5 nm)''' or '''35 Å lithography process''' is a [[technology node|full node]] semiconductor manufacturing process following the [[5 nm lithography process|5 nm process]] node. Commercial [[integrated circuit]] manufacturing using 3.5 nm process is set to begin sometimes around 2024 or 2025. The term "3.5 nm" is simply a commercial name for a generation of a certain size and its technology, as opposed to [[technology node|gate length or half pitch]]. | The '''3.5 nanometer (3.5 nm)''' or '''35 Å lithography process''' is a [[technology node|full node]] semiconductor manufacturing process following the [[5 nm lithography process|5 nm process]] node. Commercial [[integrated circuit]] manufacturing using 3.5 nm process is set to begin sometimes around 2024 or 2025. The term "3.5 nm" is simply a commercial name for a generation of a certain size and its technology, as opposed to [[technology node|gate length or half pitch]]. | ||
| + | |||
== Industry == | == Industry == | ||
| − | {{ | + | |
| + | {{future information}} | ||
| + | |||
| + | {{finfet nodes comp | ||
| + | <!-- Intel --> | ||
| + | | process 1 fab = [[Intel]] | ||
| + | | process 1 name = P1280? (CPU), P1281? (SoC) | ||
| + | | process 1 date = | ||
| + | | process 1 lith = EUV | ||
| + | | process 1 immersion = | ||
| + | | process 1 exposure = SE | ||
| + | | process 1 wafer type = Bulk | ||
| + | | process 1 wafer size = 300 nm | ||
| + | | process 1 transistor = | ||
| + | | process 1 volt = | ||
| + | | process 1 delta from = [[5 nm]] Δ | ||
| + | | process 1 fin pitch = | ||
| + | | process 1 fin pitch Δ = | ||
| + | | process 1 fin width = | ||
| + | | process 1 fin width Δ = | ||
| + | | process 1 fin height = | ||
| + | | process 1 fin height Δ = | ||
| + | | process 1 gate len = | ||
| + | | process 1 gate len Δ = | ||
| + | | process 1 cpp = | ||
| + | | process 1 cpp Δ = | ||
| + | | process 1 mmp = | ||
| + | | process 1 mmp Δ = | ||
| + | | process 1 sram hp = | ||
| + | | process 1 sram hp Δ = | ||
| + | | process 1 sram hd = | ||
| + | | process 1 sram hd Δ = | ||
| + | | process 1 sram lv = | ||
| + | | process 1 sram lv Δ = | ||
| + | | process 1 dram = | ||
| + | | process 1 dram Δ = | ||
| + | <!-- TSMC --> | ||
| + | | process 2 fab = [[TSMC]] | ||
| + | | process 2 name = | ||
| + | | process 2 date = | ||
| + | | process 2 lith = EUV | ||
| + | | process 2 immersion = | ||
| + | | process 2 exposure = SE | ||
| + | | process 2 wafer type = Bulk | ||
| + | | process 2 wafer size = 300 nm | ||
| + | | process 2 transistor = | ||
| + | | process 2 volt = | ||
| + | | process 2 delta from = [[5 nm]] Δ | ||
| + | | process 2 fin pitch = | ||
| + | | process 2 fin pitch Δ = | ||
| + | | process 2 fin width = | ||
| + | | process 2 fin width Δ = | ||
| + | | process 2 fin height = | ||
| + | | process 2 fin height Δ = | ||
| + | | process 2 gate len = | ||
| + | | process 2 gate len Δ = | ||
| + | | process 2 cpp = | ||
| + | | process 2 cpp Δ = | ||
| + | | process 2 mmp = | ||
| + | | process 2 mmp Δ = | ||
| + | | process 2 sram hp = | ||
| + | | process 2 sram hp Δ = | ||
| + | | process 2 sram hd = | ||
| + | | process 2 sram hd Δ = | ||
| + | | process 2 sram lv = | ||
| + | | process 2 sram lv Δ = | ||
| + | | process 2 dram = | ||
| + | | process 2 dram Δ = | ||
| + | <!-- GlobalFoundries --> | ||
| + | | process 3 fab = [[GlobalFoundries]] | ||
| + | | process 3 name = | ||
| + | | process 3 date = | ||
| + | | process 3 lith = EUV | ||
| + | | process 3 immersion = | ||
| + | | process 3 exposure = SE | ||
| + | | process 3 wafer type = Bulk | ||
| + | | process 3 wafer size = 300 nm | ||
| + | | process 3 transistor = | ||
| + | | process 3 volt = | ||
| + | | process 3 delta from = [[5 nm]] Δ | ||
| + | | process 3 fin pitch = | ||
| + | | process 3 fin pitch Δ = | ||
| + | | process 3 fin width = | ||
| + | | process 3 fin width Δ = | ||
| + | | process 3 fin height = | ||
| + | | process 3 fin height Δ = | ||
| + | | process 3 gate len = | ||
| + | | process 3 gate len Δ = | ||
| + | | process 3 cpp = | ||
| + | | process 3 cpp Δ = | ||
| + | | process 3 mmp = | ||
| + | | process 3 mmp Δ = | ||
| + | | process 3 sram hp = | ||
| + | | process 3 sram hp Δ = | ||
| + | | process 3 sram hd = | ||
| + | | process 3 sram hd Δ = | ||
| + | | process 3 sram lv = | ||
| + | | process 3 sram lv Δ = | ||
| + | | process 3 dram = | ||
| + | | process 3 dram Δ = | ||
| + | <!-- Samsung --> | ||
| + | | process 4 fab = [[Samsung]] | ||
| + | | process 4 name = | ||
| + | | process 4 date = | ||
| + | | process 4 lith = EUV | ||
| + | | process 4 immersion = | ||
| + | | process 4 exposure = SE | ||
| + | | process 4 wafer type = Bulk | ||
| + | | process 4 wafer size = 300 nm | ||
| + | | process 4 transistor = GAA | ||
| + | | process 4 volt = | ||
| + | | process 4 delta from = [[5 nm]] Δ | ||
| + | | process 4 fin pitch = - | ||
| + | | process 4 fin pitch Δ = | ||
| + | | process 4 fin width = | ||
| + | | process 4 fin width Δ = | ||
| + | | process 4 fin height = | ||
| + | | process 4 fin height Δ = | ||
| + | | process 4 gate len = | ||
| + | | process 4 gate len Δ = | ||
| + | | process 4 cpp = | ||
| + | | process 4 cpp Δ = | ||
| + | | process 4 mmp = | ||
| + | | process 4 mmp Δ = | ||
| + | | process 4 sram hp = | ||
| + | | process 4 sram hp Δ = | ||
| + | | process 4 sram hd = | ||
| + | | process 4 sram hd Δ = | ||
| + | | process 4 sram lv = | ||
| + | | process 4 sram lv Δ = | ||
| + | | process 4 dram = | ||
| + | | process 4 dram Δ = | ||
| + | }} | ||
== 3.5 nm Microprocessors== | == 3.5 nm Microprocessors== | ||
| Line 10: | Line 143: | ||
== 3.5 nm Microarchitectures== | == 3.5 nm Microarchitectures== | ||
{{expand list}} | {{expand list}} | ||
| + | |||
| + | == References == | ||
| + | * Kinam Kim, President of Semiconductor Business, announced MBCFET for the node after [[5 nm]], May 24, 2017 | ||
[[Category:Lithography]] | [[Category:Lithography]] | ||
Revision as of 13:53, 1 June 2017
The 3.5 nanometer (3.5 nm) or 35 Å lithography process is a full node semiconductor manufacturing process following the 5 nm process node. Commercial integrated circuit manufacturing using 3.5 nm process is set to begin sometimes around 2024 or 2025. The term "3.5 nm" is simply a commercial name for a generation of a certain size and its technology, as opposed to gate length or half pitch.
Industry
| Process Name | |
|---|---|
| 1st Production | |
| Litho- graphy |
Lithography |
| Immersion | |
| Exposure | |
| Wafer | Type |
| Size | |
| Tran- sistor |
Type |
| Voltage | |
| Fin | Pitch |
| Width | |
| Height | |
| Gate Length (Lg) | |
| Contacted Gate Pitch (CPP) | |
| Minimum Metal Pitch (MMP) | |
| SRAM bitcell |
High-Perf (HP) |
| High-Density (HD) | |
| Low-Voltage (LV) | |
| DRAM bitcell |
eDRAM |
| Intel | TSMC | GlobalFoundries | Samsung | ||||
|---|---|---|---|---|---|---|---|
| P1280? (CPU), P1281? (SoC) | |||||||
| EUV | EUV | EUV | EUV | ||||
| SE | SE | SE | SE | ||||
| Bulk | Bulk | Bulk | Bulk | ||||
| 300 nm | 300 nm | 300 nm | 300 nm | ||||
| GAA | |||||||
| Value | 5 nm Δ | Value | 5 nm Δ | Value | 5 nm Δ | Value | 5 nm Δ |
| N/A | |||||||
3.5 nm Microprocessors
This list is incomplete; you can help by expanding it.
3.5 nm Microarchitectures
This list is incomplete; you can help by expanding it.
References
- Kinam Kim, President of Semiconductor Business, announced MBCFET for the node after 5 nm, May 24, 2017