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  • |package 0 pitch=2.54 mm |package 1 pitch=2.3 mm
    5 KB (748 words) - 21:37, 21 November 2021
  • |Contacted Gate Pitch |Interconnect Pitch
    2 KB (177 words) - 23:04, 20 May 2018
  • |Contacted Gate Pitch |Interconnect Pitch
    1 KB (119 words) - 23:04, 20 May 2018
  • |Contacted Gate Pitch |Interconnect Pitch (M1P)
    3 KB (332 words) - 23:04, 20 May 2018
  • |Contacted Gate Pitch |Interconnect Pitch (M1P)
    1 KB (166 words) - 23:04, 20 May 2018
  • ...and early 1990s. A '''"0.8 µm process"''' refers to a process which has a gate length of 0.8 µm. This process was later replaced by [[650 nm]], [[600 nm] |Gate Length
    3 KB (272 words) - 23:04, 20 May 2018
  • ...a particular technology. It does not correspond to any gate length or half pitch. Nevertheless, the name convention has stuck and it's what the leading fou ...nsity doubling, the [[contacted poly pitch]] (CPP) and the [[minimum metal pitch]] (MMP) need to scale by roughly 0.7x each node. In other words, a scaling
    8 KB (1,225 words) - 13:48, 14 December 2022
  • | process 1 gate len = 30 nm | process 1 gate len Δ =  
    10 KB (1,090 words) - 19:14, 8 July 2021
  • ...on of a certain size and its technology, as opposed to gate length or half pitch. The 14 nm node was introduced in 2014/2015 and has been replaced by the [[ | process 1 fin pitch = 42 nm
    17 KB (2,243 words) - 19:32, 25 May 2023
  • ...Fab 28}} in Israel. Intel's 45 nm process is the first time high-k + metal gate transistors was used in high-volume manufacturing process. |Contacted Gate Pitch
    5 KB (602 words) - 05:51, 20 July 2018
  • ...is the first high-volume manufacturing process to introduce High-k + metal gate transistors. | Gate Pitch || 180 nm
    38 KB (5,468 words) - 20:29, 23 May 2019
  • ...[[FinFET]] transistors. This correlates to 8 nm Fin width and a 42 nm Fin pitch (shown below). SRAM cell is at 0.0706 µm² and 0.0499 µm² for high perfo | Fin Pitch || 60 nm || 42 || 0.70x
    14 KB (1,891 words) - 14:37, 6 January 2022
  • |Contacted Gate Pitch |Interconnect Pitch
    902 bytes (119 words) - 23:04, 20 May 2018
  • ...on of a certain size and its technology, as opposed to gate length or half pitch. Commercial [[integrated circuit]] manufacturing using 22 nm process began ...ransistor on the market. This process became 3rd generation high-k + metal gate transistors for Intel. In 2017 Intel announce the introduction of a new pro
    7 KB (891 words) - 09:52, 25 November 2020
  • ...on of a certain size and its technology, as opposed to gate length or half pitch. This technology is set to be replaced with [[10 nm lithography process|10 | process 1 fin pitch = 48 nm
    4 KB (580 words) - 17:00, 26 March 2019
  • ...on of a certain size and its technology, as opposed to gate length or half pitch. Commercial [[integrated circuit]] manufacturing using 20 nm process began | process 1 gate len =  
    4 KB (483 words) - 23:04, 20 May 2018
  • ...hancements. Ivy Bridge became Intel's first microarchitecture to use [[tri-gate transistor]]s for their commercial products. ...eneration of [[FinFET]]. This correlates to 8 nm Fin width and a 60 nm Fin pitch (shown below). SRAM cell is at 0.1080 µm² and 0.092 µm² for high perfor
    5 KB (689 words) - 13:44, 2 May 2020
  • ...oyed a roughly 0.7x scaling compared to the [[45 nm process]] for the gate pitch and metal 1 interconnect. ! !! Nehalem !! Westmere !! Δ !! rowspan="7" | [[File:intel 32nm gate.png|250px]]
    10 KB (1,258 words) - 21:07, 9 March 2018
  • ...is the first high-volume manufacturing process to introduce High-k + metal gate transistors. ! !! Core !! Nehalem !! Δ !! rowspan="7" | [[File:intel 45nm gate.png|250px]]
    4 KB (459 words) - 21:44, 26 December 2023
  • | Contacted Gate Pitch​ || 550 nm || 500 nm || 0.91x | Interconnect Pitch || 880 nm || 640 nm || 0.73x
    3 KB (325 words) - 21:34, 22 February 2020

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