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Difference between revisions of "intel/process"
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[[File:intel sram density scaling.png|300px|thumb|[[65 nm]] to [[32 nm]] SRAM scaling]] | [[File:intel sram density scaling.png|300px|thumb|[[65 nm]] to [[32 nm]] SRAM scaling]] | ||
[[File:intel 90nm 32nm yield.png|300px|thumb|[[90 nm]] to [[32 nm]]]] | [[File:intel 90nm 32nm yield.png|300px|thumb|[[90 nm]] to [[32 nm]]]] | ||
+ | [[File:intel scaling from 45nm to 10nm.png|300px|thumb|Intel scaling from [[45 nm]] to [[10 nm]]]] | ||
<div style="overflow-x: scroll; white-space: nowrap;"> | <div style="overflow-x: scroll; white-space: nowrap;"> | ||
<table class="wikitable" style="text-align: center;"> | <table class="wikitable" style="text-align: center;"> | ||
− | <tr><th>Year</th><th>Process</th><th>Node</th><th>MLayers</th><th>µarchs</th><th> | + | <tr><th>Year</th><th>Process</th><th>Node</th><th>MLayers</th><th>µarchs</th><th>Gate</th><th>Interconnects</th><th colspan="4">Attributes</th></tr> |
{{intel proc tech |year= |name=CHMOS I |mlayers=1 |node=3 µm | {{intel proc tech |year= |name=CHMOS I |mlayers=1 |node=3 µm | ||
|archs=8085, 8086, 8088, 80186 | |archs=8085, 8086, 8088, 80186 | ||
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}} | }} | ||
{{intel proc tech |year=2001 |name=P860 |mlayers=6 |node=0.13 µm | {{intel proc tech |year=2001 |name=P860 |mlayers=6 |node=0.13 µm | ||
+ | |xtor img=intel 130nm gate.png | ||
+ | |interconnects img=intel 130nm gate interconnect.png | ||
|archs=Pentium M | |archs=Pentium M | ||
|a1=T<sub>ox</sub> |d1=1.4 nm |a12=Gate Dielectric |d12=SiO<sub>2</sub> | |a1=T<sub>ox</sub> |d1=1.4 nm |a12=Gate Dielectric |d12=SiO<sub>2</sub> | ||
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{{intel proc tech |year=2003 |name=P1262 |mlayers=7 |node=90 nm | {{intel proc tech |year=2003 |name=P1262 |mlayers=7 |node=90 nm | ||
|xtor img=intel 90nm gate.png | |xtor img=intel 90nm gate.png | ||
+ | |interconnects img=intel_90nm_gate_interconnect.png | ||
|archs=Pentium M | |archs=Pentium M | ||
|a1=T<sub>ox</sub> |d1=1.2 nm |a12=Gate Dielectric |d12=SiO<sub>2</sub> | |a1=T<sub>ox</sub> |d1=1.2 nm |a12=Gate Dielectric |d12=SiO<sub>2</sub> | ||
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}} | }} | ||
{{intel proc tech |year=2005 |name=P1264 |mlayers=8 |node=65 nm | {{intel proc tech |year=2005 |name=P1264 |mlayers=8 |node=65 nm | ||
+ | |xtor img=intel 65nm gate.png | ||
+ | |interconnects img=intel_65nm_gate_interconnect.png | ||
|archs=Core, Modified Pentium M | |archs=Core, Modified Pentium M | ||
|a1=T<sub>ox</sub> |d1= |a12=Gate Dielectric |d12=SiO<sub>2</sub> | |a1=T<sub>ox</sub> |d1= |a12=Gate Dielectric |d12=SiO<sub>2</sub> | ||
Line 114: | Line 120: | ||
{{intel proc tech |year=2007 |name=P1266 |mlayers=9 |node=45 nm | {{intel proc tech |year=2007 |name=P1266 |mlayers=9 |node=45 nm | ||
|xtor img=intel 45nm gate.png | |xtor img=intel 45nm gate.png | ||
+ | |interconnects img=intel_45nm_gate_interconnects.png | ||
|archs=Penryn, Nehalem | |archs=Penryn, Nehalem | ||
|a1=T<sub>ox</sub> |d1= |a12=Gate Dielectric |d12=High-κ | |a1=T<sub>ox</sub> |d1= |a12=Gate Dielectric |d12=High-κ | ||
Line 121: | Line 128: | ||
}} | }} | ||
{{intel proc tech |year=2009 |name=P1268 |mlayers=10 |node=32 nm | {{intel proc tech |year=2009 |name=P1268 |mlayers=10 |node=32 nm | ||
+ | |xtor img=intel 32nm gate.png | ||
+ | |interconnects img=intel 32nm gate interconnect.png | ||
|archs=Westmere, Sandy Bridge | |archs=Westmere, Sandy Bridge | ||
|a1=T<sub>ox</sub> |d1= |a12=Gate Dielectric |d12=High-κ | |a1=T<sub>ox</sub> |d1= |a12=Gate Dielectric |d12=High-κ | ||
− | |a2=V<sub>dd</sub> |d2= | + | |a2=V<sub>dd</sub> |d2=0.75 V |a22=SRAM |d22=0.148 µm² |
|a3=L<sub>g</sub> |d3=30 nm | |a3=L<sub>g</sub> |d3=30 nm | ||
|a4=CPP |d4=112.5 nm |a42=MMP |d42=112.5 nm | |a4=CPP |d4=112.5 nm |a42=MMP |d42=112.5 nm | ||
}} | }} | ||
{{intel proc tech |year=2011 |name=P1270 |mlayers=11 |node=22 nm | {{intel proc tech |year=2011 |name=P1270 |mlayers=11 |node=22 nm | ||
+ | |xtor img=intel 22nm gate.png | ||
+ | |interconnects img=intel 22nm gate interconnect.png | ||
|archs=Ivy Bridge, Haswell | |archs=Ivy Bridge, Haswell | ||
|a1=T<sub>ox</sub> |d1= |a12=Gate Dielectric |d12=High-κ | |a1=T<sub>ox</sub> |d1= |a12=Gate Dielectric |d12=High-κ | ||
− | |a2=V<sub>dd</sub> |d2= | + | |a2=V<sub>dd</sub> |d2=0.75 V |a22=SRAM |d22=0.092 µm² |
|a3=L<sub>g</sub> |d3=26 nm | |a3=L<sub>g</sub> |d3=26 nm | ||
|a4=CPP |d4=90 nm |a42=MMP |d42=80 nm | |a4=CPP |d4=90 nm |a42=MMP |d42=80 nm | ||
}} | }} | ||
{{intel proc tech |year=2014 |name=P1272 |mlayers=11 |node=14 nm | {{intel proc tech |year=2014 |name=P1272 |mlayers=11 |node=14 nm | ||
+ | |xtor img=intel 14nm gate top.png | ||
+ | |interconnects img=intel 14nm gate interconnect.png | ||
|archs=Broadwell, Skylake, Kaby Lake, Coffee Lake | |archs=Broadwell, Skylake, Kaby Lake, Coffee Lake | ||
|a1=T<sub>ox</sub> |d1= |a12=Gate Dielectric |d12=High-κ | |a1=T<sub>ox</sub> |d1= |a12=Gate Dielectric |d12=High-κ |
Revision as of 12:44, 11 May 2017
This article details details Intel's Semiconductor Process Technology history. The table below shows the history of Intel's process scaling. Values were taken from various Intel documents including IDF presentations, ISSCC papers, and IEDM papers. Note that while a great deal of effort was put into ensuring the accuracy of the values; however some numbers vary to a small degree between Intel's own documents and therefore discrepancies may exist. SRAM bitcell areas refer to a high-density 6T bitcell with the exception of the very first few processes where smaller cell designs were used.
Timeline
Year | Process | Node | MLayers | µarchs | Gate | Interconnects | Attributes | |||
---|---|---|---|---|---|---|---|---|---|---|
CHMOS I | 3 µm | 1 | 8085, 8086, 8088, 80186 |
Tox | 70 nm | Gate Dielectric | ||||
Vdd | 5 V | SRAM | 1120 µm² | |||||||
Lg | 3.0 µm | |||||||||
CPP | 7 µm | MMP | 11 µm | |||||||
CHMOS II | 2 µm | 1 | Tox | 40 nm | Gate Dielectric | |||||
Vdd | 5 V | SRAM | 1740 µm² | |||||||
Lg | 2.0 µm | |||||||||
CPP | 5.6 µm | MMP | 8 µm | |||||||
1982 | P646 (CHMOS III) |
1.5 µm | 1 | 80286, 80386 |
Tox | 25 nm | Gate Dielectric | Si2N2O | ||
Vdd | 5 V | SRAM | 951.7 µm² | |||||||
Lg | 1.5 µm | |||||||||
CPP | 4.0 µm | MMP | 6.4 µm | |||||||
1987 | P648 | 1.0 µm | 2 | 80486 | Tox | Gate Dielectric | ||||
Vdd | 5 V | SRAM | ||||||||
Lg | 1,000 µm | |||||||||
CPP | MMP | |||||||||
1989 | P650 | 0.8 µm | 3 | 80486 | Tox | 15 nm | Gate Dielectric | |||
Vdd | 5 V | SRAM | 111 µm² | |||||||
Lg | 800 µm | |||||||||
CPP | 1.7 µm | MMP | 2 µm | |||||||
1991 | 0.6 µm | 4 | 80486, P5 |
Tox | 8 nm | Gate Dielectric | ||||
Vdd | 3.3 V | SRAM | ||||||||
Lg | 600 µm | |||||||||
CPP | MMP | 1.4 µm | ||||||||
1993 | P852 | 0.5 µm | 4 | P5 | Lg | 500 nm | ||||
Tox | 8.0 nm | Gate Dielectric | ||||||||
Vdd | 3.3 V | |||||||||
1995 | P854 | 0.35 µm | 4 | P6 | Tox | 6 nm | Gate Dielectric | SiO2 | ||
Vdd | 2.5 V | SRAM | 20.5 µm² | |||||||
Lg | 350 nm | |||||||||
CPP | 920 nm | MMP | 880 nm | |||||||
1997 | P856 | 0.25 µm | 5 | P6 | Tox | 4.08 nm | Gate Dielectric | SiO2 | ||
Vdd | 1.8 V | SRAM | 10.26 µm² | |||||||
Lg | 200 nm | |||||||||
CPP | 500 nm | MMP | 640 nm | |||||||
1998 | P856.5 | 0.25 µm | 5 | P6 | Tox | 4.08 nm | Gate Dielectric | SiO2 | ||
Vdd | 1.8 V | SRAM | 9.26 µm² | |||||||
Lg | 200 nm | |||||||||
CPP | 475 nm | MMP | 608 nm | |||||||
1999 | P858 | 0.18 µm | 6 | NetBurst | Tox | 2.0 nm | Gate Dielectric | SiO2 | ||
Vdd | 1.6 V | SRAM | 5.59 µm² | |||||||
Lg | 130 nm | |||||||||
CPP | 480 nm | MMP | 500 nm | |||||||
2001 | P860 | 0.13 µm | 6 | Pentium M | Tox | 1.4 nm | Gate Dielectric | SiO2 | ||
Vdd | 1.4 V | SRAM | 2.45 µm² | |||||||
Lg | 70 nm | |||||||||
CPP | 336 nm | MMP | 345 nm | |||||||
2003 | P1262 | 90 nm | 7 | Pentium M | Tox | 1.2 nm | Gate Dielectric | SiO2 | ||
Vdd | 1.2 V | SRAM | 1.00 µm² | |||||||
Lg | 50 nm | |||||||||
CPP | 260 nm | MMP | 220 nm | |||||||
2005 | P1264 | 65 nm | 8 | Core, Modified Pentium M |
Tox | Gate Dielectric | SiO2 | |||
Vdd | SRAM | 0.570 µm² | ||||||||
Lg | 35 nm | |||||||||
CPP | 220 nm | MMP | 210 nm | |||||||
2007 | P1266 | 45 nm | 9 | Penryn, Nehalem |
Tox | Gate Dielectric | High-κ | |||
Vdd | SRAM | 0.346 µm² | ||||||||
Lg | 25 nm | |||||||||
CPP | 160 nm | MMP | 180 nm | |||||||
2009 | P1268 | 32 nm | 10 | Westmere, Sandy Bridge |
Tox | Gate Dielectric | High-κ | |||
Vdd | 0.75 V | SRAM | 0.148 µm² | |||||||
Lg | 30 nm | |||||||||
CPP | 112.5 nm | MMP | 112.5 nm | |||||||
2011 | P1270 | 22 nm | 11 | Ivy Bridge, Haswell |
Tox | Gate Dielectric | High-κ | |||
Vdd | 0.75 V | SRAM | 0.092 µm² | |||||||
Lg | 26 nm | |||||||||
CPP | 90 nm | MMP | 80 nm | |||||||
2014 | P1272 | 14 nm | 11 | Broadwell, Skylake, Kaby Lake, Coffee Lake |
Tox | Gate Dielectric | High-κ | |||
Vdd | SRAM | 0.0499 µm² | ||||||||
Lg | 20 nm | |||||||||
CPP | 70 nm | MMP | 52 nm | |||||||
2017 | P1274 | 10 nm | Cannonlake, Icelake, Tigerlake |
Tox | Gate Dielectric | High-κ | ||||
Vdd | SRAM | 0.0312 µm² | ||||||||
Lg | 18 nm ? | |||||||||
CPP | 54 nm | MMP | 36 nm | |||||||
2019 | P1276 | 7 nm | ||||||||
2022 | P1278 | 5 nm |