Yield

Yield

Wafer Die Assembly Burn-in

Yield loss

Parametric Catastrophic

Concepts

CA CAA D0 DFM

Defect density (D₀) is the number of killer defects per unit area (typically cm²).

Overview

The defect density (D₀) of a process is the number of defects per die that are large enough to become killer defects per unit area. Defects that are small enough to not cause operational issues are not taken into account in this value.

See also

• Yield
• Critical area

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