Semiconductor & Computer Engineering
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Difference between revisions of "defect density"
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{{title|Defect Density (D<sub>0</sub>)}} | {{title|Defect Density (D<sub>0</sub>)}} | ||
'''Defect density''' ('''D<sub>0</sub>''') is the number of [[killer defects]] per unit area (typically cm²). | '''Defect density''' ('''D<sub>0</sub>''') is the number of [[killer defects]] per unit area (typically cm²). | ||
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| + | == Overview == | ||
| + | The defect density (D<sub>0</sub>) of a process is the number of defects that are large enough to become killer defects per unit area. Defects that are small enough to not cause operational issues are not taken into account in this value. | ||
== See also == | == See also == | ||
* [[Yield]] | * [[Yield]] | ||
| + | * [[Critical area]] | ||
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{{stub}} | {{stub}} | ||
Revision as of 05:21, 28 January 2019
Defect density (D0) is the number of killer defects per unit area (typically cm²).
Overview
The defect density (D0) of a process is the number of defects that are large enough to become killer defects per unit area. Defects that are small enough to not cause operational issues are not taken into account in this value.
See also
 |
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