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From WikiChip
Scan Flip-Flop (SFF)
Revision as of 22:59, 22 September 2019 by David (talk | contribs) (Undo revision 93462 by 91.11.121.152 (talk) that's not a typo. it's a MUX'ed input device)
A scan flip-flop (SFF) is a muxed input master-slave based D flip-flop. In other words, a scan flip-flop is a D flip-flop that allows its input to come from an alternative source.
Overview
A scan flip-flop is a D flip-flop with a multiplexer added at the input with one input of the MUX acting as the functional input D, with the other input serving as the Scan-In (SI) input. Scan/Test Enable (SE/TE) is used to control the MUX selection bit. Scan flip-flops are used extensively for device testing.
Chain
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See also
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