A scan flip-flop is a D flip-flop with a 2x1 multiplexer added at its input D. one input of the MUX acting as the functional input D when SE/TE=0 and the other input serving as the Scan-In (SI) input when SE/TE=1. Scan/Test Enable (SE/TE) is used to control the MUX i.e used as selection bit. Scan flip-flops are used extensively for device testing.
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