Semiconductor & Computer Engineering
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Difference between revisions of "scan flip-flop"
(corrected spelling mistake: muxed -> mixed) |
(Undo revision 93462 by 91.11.121.152 (talk) that's not a typo. it's a MUX'ed input device) |
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{{title|Scan Flip-Flop (SFF)}}[[File:scan flip flop.svg|right|200px]] | {{title|Scan Flip-Flop (SFF)}}[[File:scan flip flop.svg|right|200px]] | ||
| − | A '''scan flip-flop''' ('''SFF''') is a | + | A '''scan flip-flop''' ('''SFF''') is a muxed input master-slave based [[D flip-flop]]. In other words, a scan flip-flop is a [[D flip-flop]] that allows its input to come from an alternative source. |
== Overview == | == Overview == | ||
Revision as of 21:59, 22 September 2019
A scan flip-flop (SFF) is a muxed input master-slave based D flip-flop. In other words, a scan flip-flop is a D flip-flop that allows its input to come from an alternative source.
Overview
A scan flip-flop is a D flip-flop with a multiplexer added at the input with one input of the MUX acting as the functional input D, with the other input serving as the Scan-In (SI) input. Scan/Test Enable (SE/TE) is used to control the MUX selection bit. Scan flip-flops are used extensively for device testing.
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