Semiconductor & Computer Engineering
From WikiChip
Difference between revisions of "scan flip-flop"
(SFF) |
|||
| Line 1: | Line 1: | ||
| − | {{title|Scan Flip-Flop}} | + | {{title|Scan Flip-Flop (SFF)}} |
| − | A '''scan flip-flop''' ('''SFF''') is a muxed input master-slave based [[D flip-flop]]. | + | A '''scan flip-flop''' ('''SFF''') is a muxed input master-slave based [[D flip-flop]]. In other words, a scan flip-flop is a [[D flip-flop]] that allows its input to come from an alternative source. |
== Overview == | == Overview == | ||
| − | A scan flip-flop is a [[D flip-flop]] with a [[multiplexer]] added at the input with one input of the MUX acting as the functional input D, with the other input serving as the Scan-In (SI) input. Scan Enable (SE) is used to control the MUX selection bit. | + | A scan flip-flop is a [[D flip-flop]] with a [[multiplexer]] added at the input with one input of the MUX acting as the functional input D, with the other input serving as the Scan-In (SI) input. Scan/Test Enable (SE/TE) is used to control the MUX selection bit. Scan flip-flops are used extensively for device testing. |
== See also == | == See also == | ||
Revision as of 08:57, 23 May 2018
A scan flip-flop (SFF) is a muxed input master-slave based D flip-flop. In other words, a scan flip-flop is a D flip-flop that allows its input to come from an alternative source.
Overview
A scan flip-flop is a D flip-flop with a multiplexer added at the input with one input of the MUX acting as the functional input D, with the other input serving as the Scan-In (SI) input. Scan/Test Enable (SE/TE) is used to control the MUX selection bit. Scan flip-flops are used extensively for device testing.