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File:intel 22nm sac yield improvement.png
Revision as of 23:54, 27 January 2019 by David (talk | contribs) (Intel 22 nm process yield improvement due to SAC and contact misalignment.)
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Summary

Intel 22 nm process yield improvement due to SAC and contact misalignment.

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current23:54, 27 January 2019Thumbnail for version as of 23:54, 27 January 20191,902 × 1,380 (141 KB)David (talk | contribs)Intel 22 nm process yield improvement due to SAC and contact misalignment.
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Horizontal resolution 37.8 dpc
Vertical resolution 37.8 dpc
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