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Difference between revisions of "File:intel 22nm sac yield improvement.png"
(Intel 22 nm process yield improvement due to SAC and contact misalignment.) |
(No difference)
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Latest revision as of 23:54, 27 January 2019
Summary[edit]
Intel 22 nm process yield improvement due to SAC and contact misalignment.
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This work is copyrighted (or assumed to be copyrighted) and unlicensed. However, it is believed that the use of this work qualifies as fair use under United States copyright law. |
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Date/Time | Thumbnail | Dimensions | User | Comment | |
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current | 23:54, 27 January 2019 | 1,902 × 1,380 (141 KB) | David (talk | contribs) | Intel 22 nm process yield improvement due to SAC and contact misalignment. |
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Horizontal resolution | 37.8 dpc |
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Vertical resolution | 37.8 dpc |