Semiconductor & Computer Engineering
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Difference between revisions of "transistor density"
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The real or '''effective transistor density''' of a [[die]] can be calculated through: | The real or '''effective transistor density''' of a [[die]] can be calculated through: | ||
| + | <math>\text{effective transistor density} = \frac{\text{transistor count}}{\text{die area}}</math> | ||
| − | + | === Variability === | |
| + | Although the effective transistor density provides the average density of the transistor for a particular real-world product, it is not possible to compare different product families in such a way due to numerous reasons, including: | ||
| + | |||
| + | * Interconnect consideration | ||
| + | * Performance consideration | ||
| + | * [[Std. cell]] vs Full custom | ||
| + | * Ratio of components on-die | ||
Latest revision as of 23:38, 9 January 2019
Transistor density (xTor Density) refers to the number of transistors that are fabricated per unit area.
Overview[edit]
The transistor density of a monolithic integrated circuit refers to the number of individual transistors that can be packed into a set amount of area.
The real or effective transistor density of a die can be calculated through:
Variability[edit]
Although the effective transistor density provides the average density of the transistor for a particular real-world product, it is not possible to compare different product families in such a way due to numerous reasons, including:
- Interconnect consideration
- Performance consideration
- Std. cell vs Full custom
- Ratio of components on-die