Semiconductor & Computer Engineering
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Difference between revisions of "iddq"
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| − | '''I<sub>DDQ</sub>''' is the [[current]] of the V<sub>DD</sub> power supply in the quiescent state. In other words, it is the supply current (I<sub>DD</sub>) after a switching has occurred and prior to the next change. This current measurement is used in [[IDDQ testing|I<sub>DDQ</sub> testing]] in order to detect possible defects. | + | '''I<sub>DDQ</sub>''' is the [[current]] of the V<sub>DD</sub> power supply in the quiescent state. In other words, it is the supply current (I<sub>DD</sub>) after a switching has occurred and prior to the next change. This current measurement is also used in [[IDDQ testing|I<sub>DDQ</sub> testing]] in order to detect possible defects. |
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| + | [[Category:device testing]] | ||
Latest revision as of 21:27, 25 June 2018
IDDQ is the current of the VDD power supply in the quiescent state. In other words, it is the supply current (IDD) after a switching has occurred and prior to the next change. This current measurement is also used in IDDQ testing in order to detect possible defects.
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