-
WikiChip
WikiChip
-
Architectures
Popular x86
-
Intel
- Client
- Server
- Big Cores
- Small Cores
-
AMD
Popular ARM
-
ARM
- Server
- Big
- Little
-
Cavium
-
Samsung
-
-
Chips
Popular Families
-
Ampere
-
Apple
-
Cavium
-
HiSilicon
-
MediaTek
-
NXP
-
Qualcomm
-
Renesas
-
Samsung
-
From WikiChip
Difference between revisions of "iddq"
(initial page) |
|||
Line 5: | Line 5: | ||
{{stub}} | {{stub}} | ||
+ | |||
+ | [[Category:device testing]] |
Revision as of 21:26, 25 June 2018
IDDQ is the current of the VDD power supply in the quiescent state. In other words, it is the supply current (IDD) after a switching has occurred and prior to the next change. This current measurement is used in IDDQ testing in order to detect possible defects.
This article is still a stub and needs your attention. You can help improve this article by editing this page and adding the missing information. |
Retrieved from "https://en.wikichip.org/w/index.php?title=iddq&oldid=79588"