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Scan Flip-Flop (SFF)
Revision as of 04:09, 27 August 2019 by 91.11.121.152 (talk) (corrected spelling mistake: muxed -> mixed)

scan flip flop.svg

A scan flip-flop (SFF) is a mixed input master-slave based D flip-flop. In other words, a scan flip-flop is a D flip-flop that allows its input to come from an alternative source.

Overview

A scan flip-flop is a D flip-flop with a multiplexer added at the input with one input of the MUX acting as the functional input D, with the other input serving as the Scan-In (SI) input. Scan/Test Enable (SE/TE) is used to control the MUX selection bit. Scan flip-flops are used extensively for device testing.

Chain

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chain scan flip flop.svg

See also


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