Semiconductor & Computer Engineering
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Difference between revisions of "scan flip-flop"
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| − | {{title|Scan Flip-Flop (SFF)}} | + | {{title|Scan Flip-Flop (SFF)}}[[File:scan flip flop.svg|right|200px]] |
A '''scan flip-flop''' ('''SFF''') is a muxed input master-slave based [[D flip-flop]]. In other words, a scan flip-flop is a [[D flip-flop]] that allows its input to come from an alternative source. | A '''scan flip-flop''' ('''SFF''') is a muxed input master-slave based [[D flip-flop]]. In other words, a scan flip-flop is a [[D flip-flop]] that allows its input to come from an alternative source. | ||
== Overview == | == Overview == | ||
A scan flip-flop is a [[D flip-flop]] with a [[multiplexer]] added at the input with one input of the MUX acting as the functional input D, with the other input serving as the Scan-In (SI) input. Scan/Test Enable (SE/TE) is used to control the MUX selection bit. Scan flip-flops are used extensively for device testing. | A scan flip-flop is a [[D flip-flop]] with a [[multiplexer]] added at the input with one input of the MUX acting as the functional input D, with the other input serving as the Scan-In (SI) input. Scan/Test Enable (SE/TE) is used to control the MUX selection bit. Scan flip-flops are used extensively for device testing. | ||
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| + | == Chain == | ||
| + | {{empty section}} | ||
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| + | :[[File:chain scan flip flop.svg|600px]] | ||
== See also == | == See also == | ||
Revision as of 11:25, 23 May 2018
A scan flip-flop (SFF) is a muxed input master-slave based D flip-flop. In other words, a scan flip-flop is a D flip-flop that allows its input to come from an alternative source.
Overview
A scan flip-flop is a D flip-flop with a multiplexer added at the input with one input of the MUX acting as the functional input D, with the other input serving as the Scan-In (SI) input. Scan/Test Enable (SE/TE) is used to control the MUX selection bit. Scan flip-flops are used extensively for device testing.
Chain
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See also
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