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65 nm lithography process
Revision as of 22:39, 14 January 2018 by At32Hz (talk | contribs) (65 nm Microarchitectures)

The 65 nanometer (65 nm) lithography process is a full node semiconductor manufacturing process following the 80 nm process stopgap. Commercial integrated circuit manufacturing using 65 nm process began in 2005. This technology was superseded by the 55 nm process (HN) / 45 nm process (FN) in 2007.

Industry

Fab
Process Name​
1st Production​
Wafer​
Metal Layers​
 ​
Contacted Gate Pitch​
Interconnect Pitch (M1P)​
SRAM bit cell (HD)​
SRAM bit cell (LP)​
DRAM bit cell
Intel IBM / Toshiba / Sony / AMD TI IBM / Chartered / Infineon / Samsung TSMC Fujitsu
P1264 CS-200/CS-201/CS-250
2005 2005 2007 2005 2005 2006
300mm
8 10 11 10 11
Value 90 nm Δ Value 90 nm Δ Value 90 nm Δ Value 90 nm Δ Value 90 nm Δ Value 90 nm Δ
220 nm 0.85x 250 nm  ?x  ? nm  ?x 200 nm 0.82x 160 nm 0.67x  ? nm  ?x
210 nm 0.95x  ? nm  ?x  ? nm  ?x 180 nm 0.73 180 nm 0.75x  ? nm  ?x
0.570 µm² 0.57x 0.540 µm² 0.49 µm² 0.540 µm² 0.55x 0.499 µm² 0.50x
0.680 µm² 0.65 µm² 0.65x 0.49 µm² 0.676 µm² 0.54x 0.525 µm² 0.53x  ? µm²  ?x
0.127 µm² 0.67x 0.189 µm² 0.69x

Design Rules

65 nm Microprocessors

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65 nm Microarchitectures

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