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Difference between revisions of "32 nm lithography process"

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The '''32 nm lithography process''' is a [[technology node|full node]] semiconductor manufacturing process following the [[40 nm lithography process|40 nm process]] stopgap. Commercial [[integrated circuit]] manufacturing using 32 nm process began in 2010. This technology was superseded by the [[28 nm lithography process|28 nm process]] (HN) / [[22 nm lithography process|22 nm process]] (FN) in 2012.
 
The '''32 nm lithography process''' is a [[technology node|full node]] semiconductor manufacturing process following the [[40 nm lithography process|40 nm process]] stopgap. Commercial [[integrated circuit]] manufacturing using 32 nm process began in 2010. This technology was superseded by the [[28 nm lithography process|28 nm process]] (HN) / [[22 nm lithography process|22 nm process]] (FN) in 2012.
  
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== Industry ==
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=== Intel ===
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{| class="wikitable"
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|-
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| || Measurement || Scaling from [[45 nm]]
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|-
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| Contacted Gate Pitch || 112.5 nm || 0.63x
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|-
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| Interconnect Pitch (M1P) || 112.5 nm || 0.70x
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|-
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| [[SRAM]] bit cell || 0.171 µm<sup>2</sup> || 0.63x
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|}
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{| class="wikitable"
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|-
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! colspan="4" | Design Rules
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|-
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! Layer !! Pitch !! Thick !! Aspect Ratio
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|-
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| Isolation || 140 nm || 200 || -
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|-
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| Contacted Gate ||  112.5 nm || 35 nm || --
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|-
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| Metal 1 || 112.5 nm || 95 nm || 1.7
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|-
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| Metal 2 || 112.5 nm || 95 nm || 1.7
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|-
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| Metal 3 || 112.5 nm || 95 nm || 1.7
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|-
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| Metal 4 || 168.8 nm || 151 nm || 1.8
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|-
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| Metal 5 || 225.0 nm || 204 nm || 1.8
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|-
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| Metal 6 || 337.6 nm || 303 nm || 1.8
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|-
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| Metal 7 || 450.1 nm || 388 nm || 1.7
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|-
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| Metal 8 || 566.5 nm || 504 nm || 1.8
 +
|-
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| Metal 9 || 19.4 µm || 8 µm || 1.5
 +
|}
 
== 32 nm Microprocessors==
 
== 32 nm Microprocessors==
 
* AMD
 
* AMD

Revision as of 19:41, 23 April 2016

The 32 nm lithography process is a full node semiconductor manufacturing process following the 40 nm process stopgap. Commercial integrated circuit manufacturing using 32 nm process began in 2010. This technology was superseded by the 28 nm process (HN) / 22 nm process (FN) in 2012.

Industry

Intel

Measurement Scaling from 45 nm
Contacted Gate Pitch 112.5 nm 0.63x
Interconnect Pitch (M1P) 112.5 nm 0.70x
SRAM bit cell 0.171 µm2 0.63x
Design Rules
Layer Pitch Thick Aspect Ratio
Isolation 140 nm 200 -
Contacted Gate 112.5 nm 35 nm --
Metal 1 112.5 nm 95 nm 1.7
Metal 2 112.5 nm 95 nm 1.7
Metal 3 112.5 nm 95 nm 1.7
Metal 4 168.8 nm 151 nm 1.8
Metal 5 225.0 nm 204 nm 1.8
Metal 6 337.6 nm 303 nm 1.8
Metal 7 450.1 nm 388 nm 1.7
Metal 8 566.5 nm 504 nm 1.8
Metal 9 19.4 µm 8 µm 1.5

32 nm Microprocessors

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32 nm System on Chips

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32 nm Microarchitectures

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