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Difference between revisions of "16 nm lithography process"

(Industry)
(Industry)
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  | process 1 transistor  = FinFET
 
  | process 1 transistor  = FinFET
 
  | process 1 volt        = 0.75 V
 
  | process 1 volt        = 0.75 V
  | process 1 delta from  = [[28 nm]] Δ
+
  | process 1 delta from  = [[20 nm]] Δ
 
  | process 1 fin pitch    = 48 nm
 
  | process 1 fin pitch    = 48 nm
 
  | process 1 fin pitch Δ  = -
 
  | process 1 fin pitch Δ  = -

Revision as of 10:04, 5 April 2017

The 16 nanometer (16 nm) lithography process is a full node semiconductor manufacturing process following the 20 nm process stopgap. Commercial integrated circuit manufacturing using 16 nm process began in 2014. The term "16 nm" is simply a commercial name for a generation of a certain size and its technology, as opposed to gate length or half pitch. This technology is set to be replaced with 10 nm process in 2017.

Industry

 
Process Name
1st Production
Lithography Lithography
Immersion
Exposure
Wafer Type
Size
Transistor Type
Voltage
 
Fin Pitch
Width
Height
Gate Length (Lg)
Contacted Gate Pitch (CPP)
Minimum Metal Pitch (MMP)
SRAM bitcell High-Perf (HP)
High-Density (HD)
Low-Voltage (LV)
DRAM bitcell eDRAM
TSMC
16FF
2016
193 nm
Yes
 
Bulk
300 mm
FinFET
0.75 V
Value 20 nm Δ
48 nm N/A
 
37 nm
34 nm
90 nm 1x
64 nm 1x
   
0.074 µm² 0.86x
   
   

TSMC

TSMC demonstrated their 128 Mebibit SRAM wafer from their 16 nm HKMG FinFET process at the 2014 IEEE ISSCC.

16 nm Microprocessors

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16 nm Microarchitectures

This list is incomplete; you can help by expanding it.

References

  • Chen, Yen-Huei, et al. "A 16 nm 128 Mb SRAM in High-κ Metal-Gate FinFET Technology With Write-Assist Circuitry for Low-VMIN Applications." IEEE Journal of Solid-State Circuits 50.1 (2015): 170-177.
  • Wu, Shien-Yang, et al. "A 16nm FinFET CMOS technology for mobile SoC and computing applications." Electron Devices Meeting (IEDM), 2013 IEEE International. IEEE, 2013.
  • TechInsights/Chipworks, Kevin Gibb, The ConFab 2016